G120 Flatness Measurement System

Overview

Model name provided: G120 Flatness Measurement System. The Logitech GI20 is described in the product text as a high-precision grazing incidence interferometer purpose-built for measuring the flatness of samples up to 150mm in diameter. Power supply is listed as 240V/110V, 50Hz. External dimensions are Height: 260mm, Depth: 602mm, Width: 430mm, and weight is 24kg. Maximum sample size is 150mm (6″), surface roughness range is 1nm to 300nm Ra, and fringe spacing is 2µm. The system includes a user-friendly 7" touchscreen interface and provides HDMI output and USB export for extended analysis or reporting. The product text states the GI20 is ideal for quality checks on lapped, ground, or semi-polished materials before final polishing and is capable of analyzing non-reflective and rougher surfaces up to 300nm Ra. Logitech lists applications for its systems including Semiconductors (including thinning of III-V, IR and similar materials and stages such as wafer slicing, surface preparation and thinning), Optoelectronics (preparing materials like silicon and lithium niobate), Optics (cutting, lapping and polishing optical materials for IR, waveguides and fiber optics), Geological Sciences (high-quality thin section production for rocks, soils, coal, concrete and fluid inclusions) and Other Applications (thin section preparation of Teeth, Bone, Otoliths, Ceramics, Metals, Alloys, Polymers and other Carbon-based materials).