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EX-QS Wafer Mapping
Nordson Corporation
Categories:
Automated Optical Inspection Systems
Model Overview
EX-QS Wafer Mapping is an EX-Q repackaged in a smaller case to accommodate applications where space is limited. EX-QS wafer mapping sensors give the same reliable wafer detection and easy integration as the EX-Q and are available in two standoff distances: 1.5″ and 2.2″. They detect bright, dark and...
Technical Specifications
Detectsbright, dark and coated wafers; cross-slotted and ultra-thin wafers
Form Factorrepackaged smaller case
Category PathTest & Measurement > Optical & Visual Inspection > Automated Optical Inspection Systems
Interface Typeoff-the-shelf direct interface (no amplification or signal conditioning required)
Manufacturer ID6a71c270-a27f-4dcf-b906-30dd58a800e5
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