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FP3000W
Accreatech (Tokyo Seimitsu)
Categories:
Automated Test Equipment
Optical & Laser Measurement Systems
Gauging Systems
Model Overview
FP3000W is a high precision probing machine for 300 mm framed wafers (Φ300mm). It is described as a high precision model for the 300 mm wafers and the product description lists "Diced Wafer" and "MEMS" as descriptors. The model supports CSP/WLP/PLP devices that are affixed on dicing frames and per...
Technical Specifications
Options8/12 inch wafer transfer dual mechanism,8 inch frame transfer mechanism,Multiple barcode management,FFU to realize clean testing environment,Hinge-type manipulator for test-head,High-temperature testing environment,Ultra-high magnification color optical system,Needle track inspecting function,PLP testing for diced 300mm square,PLP testing for up to 330mm square
DescriptorsDiced Wafer,MEMS
Product Typehigh precision probing machine
Category PathTest & Measurement > Electrical & Electronic Testing > Automated Test Equipment
Device Mountingaffixed on dicing frames
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