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LA4-class Logic Analyzer, with state mode up to 4 Gb/s (Model: U4164A)
Keysight Technologies, Inc.
Model Overview & Specs
Overview
LA4-class Logic Analyzer, Model U4164A, is a logic analyzer module with state mode up to 4 Gb/s and timing mode up to 10 GHz. The product description states it is the industry’s highest-data-rate state-mode (up to 4 Gb/s) and can enable validation and debug of DDR4 or LPDDR4 at data rates over 3.5 Gb/s. Key specifications from the module: Maximum memory depth: 400 Mpts; Number of channels: 136; Maximum state mode data rate: 4 Gb/s; Timing mode: 10 GHz; Standards: LPDDR5, LPDDR4, LPDDR3, LPDDR2, LPDDR, DDR5, DDR4, DDR3, DDR2, DDR. The product text also lists memory depth options of 400 Mb full channel timing, 800 Mb ½ channel timing, and 1.6 Gb ¼ channel timing. The module supports two modes of operation: quad sample state mode and 10 GHz quarter channel timing mode. Quad sample state mode provides four samples at two independently adjusted thresholds from a single probe point on each input, and quarter channel timing mode provides up to 1.6 Gb samples per input. Additional features called out include timing mode de-skew control, dual thresholds in dual sample state mode, clock hysteresis control, eye scan technology with up to 5 ps x 5 mV scan increments, and a 12.5 GHz, 256K deep timing zoom. The U4164A is described for modular high-speed memory validation and debugging, specifically enabling validation and debug of DDR4 or LPDDR4 at data rates over 3.5 Gb/s. It is presented for use with DDR and LPDDR memory standards listed in the specifications. The product description also references the B4661A Memory Analysis software, which offers tools to accelerate setup and configurations for DDR / 2 / 3 / 4 / 5 and LPDDR / 1 / 2 / 3 / 4 / 5 measurements and licensed options for DDR / 2 / 3 / 4 / 5, LPDDR / 1 / 2 / 3 / 4 / 5 and ONFi memory analysis and validation. The module’s quad sample state mode, timing mode, and memory depth options are described as enabling capture and analysis of high-speed memory signals for those measurement tasks.
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