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Jeol【DISCONTINUED】JSM-IT500HR InTouchScope™ Scanning Electron Microscope

【DISCONTINUED】JSM-IT500HR InTouchScope™ Scanning Electron Microscope

Jeol

Categories:
Microscopy & Imaging Systems
Equipment

Model Overview

The JSM-IT500HR InTouchScope™ is a JEOL scanning electron microscope (SEM) model designated for high-resolution imaging; the unit is listed as discontinued. As an SEM, it delivers electron-beam–based imaging for surface morphology and compositional contrast, providing the large depth-of-field and ad...

Technical Specifications

Statusdiscontinued
Featureshigh-resolution imaging,large depth-of-field,adjustable magnification,adjustable beam conditions
Imaging Modeelectron-beam–based imaging
Product TypeScanning Electron Microscope (SEM)
Category PathTest & Measurement > Optical & Visual Inspection > Microscopy & Imaging Systems

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