Hi-pot test machine

Overview

Functions include cell feeding ratchet mechanism, tab orientation, transfer unit, Hi-pot test, CCD inspection, and NG sorting. The testing station is servo driven, with correction time ≤ 0.5s and correction accuracy ≤ ±2°. NG collection employs two separate NG collection channels for Hi-pot test and CCD inspection NG products. CCD inspection covers tab angle and TI warping inspection. The Hi-pot tester provides automatic electric discharge. Performs Hi-pot testing with automatic electric discharge, CCD inspection for tab angle and TI warping, and NG sorting using two separate NG collection channels for Hi-pot and CCD NG products. Also provides cell feeding via a ratchet mechanism, tab orientation and transfer unit, with a servo-driven testing station delivering correction time ≤ 0.5s and correction accuracy ≤ ±2°.