TESCAN AMBER 2

Overview

TESCAN AMBER 2 is a fully automated Ga FIB-SEM for routine TEM sample preparation, nanoscale characterization, and prototyping. It delivers exceptionally high FIB image quality even at low accelerating voltages and uses the field-free BrightBeam™ SEM column for high-contrast nanoscale imaging and sample versatility. The system includes a high current Orage™ FIB column and a multimodal detection system that enables simultaneous acquisition of multiple signals. TESCAN Essence™ software automates SEM and FIB alignments and provides advanced stage collision protection, and the platform supports TESCAN’s Electron Beam Lithography and Fast Beam Blanker. AMBER 2 is used to prepare high-quality TEM samples automatically with minimal damage and to perform advanced TEM lamella preparation that targets excellent quality, optimal geometry, and minimal amorphization damage. It is applied to FIB nanoprototyping to fabricate, create, or modify materials into functional devices and to electron beam lithography, FEBID, and FIBID for crafting precise functional prototypes at nano and micro scales. The instrument supports advanced SEM contrast methods to enhance surface sensitivity and phase detection, enables ultra-high-resolution imaging and nanoanalysis on diverse materials, can prepare inverted or planar samples and transfer them to the grid with a nanomanipulator, and is positioned to support Semiconductors and IC Packaging Failure Analysis; a TEM specimen can be prepared automatically in less than 1h using TEM AutoPrep Pro™.