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RE-3500
SCREEN Semiconductor Solutions (SCREEN SPE)
Categories:
Microscopy & Imaging Systems
Model Overview
Ellipsometric Film Thickness Measurement System: RE-3500. The RE-3500 provides highly precise measurement of minute areas at 40 μm square through the use of microspot optics. A newly-developed optical head offers twice the throughput of the previous model. As a spectroscopic ellipsometer, the RE-350...
Technical Specifications
Category PathTest & Measurement > Optical & Visual Inspection > Microscopy & Imaging Systems
Instrument TypeEllipsometric Film Thickness Measurement System
Manufacturer ID94dcbe27-1cc3-4606-87c8-730c9184c1ae
Microspot Opticsmicrospot optics
Ellipsometer Typespectroscopic ellipsometer
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