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SEMVision G7 Defect Analysis
Applied Material
Categories:
Automated Optical Inspection Systems
Model Overview
The SEMVision G7 Defect Analysis is a scanning electron microscope (SEM)-based defect review and analysis platform from Applied Materials designed for semiconductor manufacturing environments. It performs high-resolution electron imaging to capture morphological detail of wafer- and die-level defect...
Technical Specifications
Integrationintegration with factory data systems and yield-management flows
Category PathTest & Measurement > Optical & Visual Inspection > Automated Optical Inspection Systems
Operation Modeautomated, recipe-driven operation
Manufacturer ID3ac7ba29-f554-4cc9-b2f6-a655474b1267
Sample Handlingwafer-level sample handling
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