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Hysitron Accelerated Property Mapping (XPM)
Bruker Corporation
Categories:
Universal Testing Machines
Model Overview
Hysitron Accelerated Property Mapping (XPM) is an upgrade module offered through Bruker’s nanomechanical test system upgrade options that provides ultra-fast nanoindentation capability for spatially resolved mechanical property mapping. It is configured to integrate with existing Bruker/Hysitron nan...
Technical Specifications
Capabilityultra-fast nanoindentation capability
Data Outputdense, spatially correlated nanoindentation data sets
Form Factoradd-on
Mapping Typespatially resolved mechanical property mapping
Product Typeupgrade module
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