Loresta GX II – Low Resistivity Meter

Overview

The Loresta GX II is a laboratory/production resistivity meter that measures resistance, sheet resistance, and volume resistivity using the 4-pin method. It features a 7.5” TFT-LCD touch screen monitor for operator input and readout and supports one-touch measurement via an MCP probe that reports values in Ω, Ω/sq, and Ω-cm. Measurement range is expanded to 10-4-107Ω and the instrument includes a dedicated Silicon mode for silicon wafer measurement. Measurement workflow is automated with one-touch operation, auto-hold and timer modes to capture stable readings without manual intervention. Data handling includes memory backup for 1,000 pieces of data with USB-download capability, and a wide range of optional probes is available to adapt to different sample geometries. The meter’s results correlate to ASTM D257 and JIS K 6911 test standards. Designed for industrial materials testing and electronics manufacturing QA/QC, the Loresta GX II is suitable for resistivity and sheet-resistance measurement of conductive coatings, conductive polymers, thin films and silicon wafers. The 4-pin measurement method and optional probe selection make it appropriate for both bench-top lab characterization and routine production-line spot checks where contact resistance must be minimized. Its one-touch operation, auto-hold/timer modes and USB-downloadable 1,000-sample memory support high-throughput sampling workflows and traceable data collection for process control and certification against ASTM D257 and JIS K 6911 standards.