【DISCONTINUED】JEM-1400Flash Electron Microscope

Overview

Transmission electron microscope (TEM) configured for high-magnification, high-resolution imaging with an accelerating voltage range of 10 to 120 kV. Optical performance notes include resolution values of 0.2 nm (HC) and 0.14 nm（HR） and magnification ranges of ×10 to ×1,200,000 (HC) and ×10 to ×1,500,000 (HR). Vacuum system is listed as "TMP." Maximum specimen tilt is ±70° when equipped with the optional high tilt specimen holder. Sample handling can be configured to load up to 4 specimens when using the optional specimen quartet holder. Designed for industrial research and production laboratories that require nanoscale imaging and analysis of thin specimens — examples include materials characterization, semiconductor process and failure analysis, and nanomaterials or thin‑film inspection. The 10 to 120 kV accelerating voltage range supports imaging across a range of specimen types and thicknesses and allows lower-voltage operation for more beam‑sensitive materials. The ±70° maximum tilt with the optional high‑tilt holder supports tilt-series acquisition and 3D reconstruction workflows (electron tomography). Optional specimen quartet loading increases sample throughput for routine analyses and comparative studies in process control or R&D settings.