Vue Series

Overview

The Vue Serie supports pulse-echo inspection and through-transmission imaging (through-transmission not available on Mini Vue) and delivers A-Scan waveforms, B-Scan cross-sectional images, C-Scan planar images, TOF – Time-of-Flight images, and THK – wall thickness images. Measurement outputs include time domain, frequency domain, maximum peak amplitude, positive and negative peak amplitude, Time of Flight to peaks and edges, and user-side signal processing. The software provided is ODIS (OKOS Digital Imaging System), described as the latest generation of acoustic microscopy software developed on modern platforms with extensive industry feedback, offering a comprehensive set of quantitative tools for precise measurement, characterization and classification of components and enabling fast, reliable assessment of a wide range of materials and applications. User interface modes are Advanced | Engineer | Operator. Available models listed are Mini Vue, VUE 250-P, Vue 400-P and Macrovue-P with per-model specifications: Mini Vue — Voltage: 120/240 VAC, 5 Ampere; Water type: Type 2 deionized; Scan field: 200 mm x 100 mm; Transducer: 15, 35, 75, 110 MHz; Operating system: Windows 11 Pro O/S. VUE 250-P — Voltage: 120/240 VAC, 5 Ampere; Water type: Type 2 deionized; Scan field: 322 mm x 136 mm; Transducer: 1 MHz bis 230 MHz; Operating system: Windows 11 Pro O/S. Vue 400-P — Voltage: 120/240 VAC, 5 Ampere; Water type: Type 2 deionized; Scan field: 380 mm x 360 mm; Transducer: 1 MHz bis 230 MHz; Operating system: Windows 11 Pro O/S. Macrovue-P — Voltage: 120/240 VAC, 5 Ampere; Water type: Type 2 deionized; Scan field: 600 x 600 to 2.500 x 1.500 mm x 1.300 mm; Transducer: 1 MHz bis 230 MHz; Operating system: Windows 11 Pro O/S. Inspection and analysis capabilities explicitly supported include Multi-Zone-Inspection (SALI), acquisition and review of C-Scans, B-Scans and A-Scans, analysis of peak amplitude and Time of Flight, defect detection, and wall thickness measurement. The system provides advanced analysis functions such as cluster analysis, histogram generation, void analysis, quantification, and Go/No-Go classification. These features are enabled and managed through the ODIS software environment and the provided user interface modes (Advanced | Engineer | Operator).