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Benchtop SEM JCM-7000 NeoScope1
Jeol
Categories:
Microscopy & Imaging Systems
Model Overview
Benchtop scanning electron microscope (SEM), model JCM-7000 NeoScope, manufactured by JEOL. The unit is a compact, laboratory/benchtop form factor SEM intended for installation in research laboratories and production-floor metrology or QA stations. It provides electron-beam imaging for high-magnific...
Technical Specifications
Form Factorcompact, laboratory/benchtop
Imaging Modeelectron-beam imaging
Category PathTest & Measurement > Optical & Visual Inspection > Microscopy & Imaging Systems
Equipment TypeBenchtop scanning electron microscope (SEM)
Manufacturer IDb8c1ccca-5b09-40ec-84ea-07e0d577cd57
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